D.O.D. Data Sanitization Matrix

Standard DoD 5220.22-M, US DoD 5220.22-M (ECE)

US Department of Defense in the clearing and sanitizing standard DoD 5220.22-M recommends the approach “Overwrite all addressable locations with a character, its complement, then a random character and verify” (see table with comments) for clearing and sanitizing information on a writable media.

US Department of Defense 5220.22-M Clearing and Sanitization Matrix

Media Clear Sanitize
Magnetic Tape1
Type I a or b a, b, or m
Type II a or b b or m
Type III a or b m
Magnetic Disk
Bernoullis a, b, or c m
Floppies a, b, or c m
Non-Removable Rigid Disk c a, b, d , or m
Removable Rigid Disk a, b, or c a, b, d , or m
Optical Disk
Read Many, Write Many c m
Read Only m, n
Write Once, Read Many (Worm) m, n
Memory
Dynamic Random Access memory (DRAM) c or g c, g, or m
Electronically Alterable PROM (EAPROM) i j or m
Electronically Erasable PROM (EEPROM) i h or m
Erasable Programmable (ROM (EPROM) k l, then c, or m
Flash EPROM (FEPROM) i c then i, or m
Programmable ROM (PROM) c m
Magnetic Bubble Memory c a, b, c, or m
Magnetic Core Memory c a, b, e, or m
Magnetic Plated Wire c c and f, or m
Magnetic Resistive Memory c m
Nonvolatile RAM (NOVRAM) c or g c, g, or m
Read Only Memory ROM m
Static Random Access Memory (SRAM) c or g c and f, g, or m
Equipment
Cathode Ray Tube (CRT) g q
Printers
Impact g p then g
Laser g o then g

US Department of Defense 5220.22-M Clearing and Sanitization Matrix

a. Degauss with a Type I degausser

b. Degauss with a Type II degausser.

c. Overwrite all addressable locations with a single character.

d. Overwrite all addressable locations with a character, its complement, then a random character and verify. THIS METHOD IS NOT APPROVED FOR SANITIZING MEDIA THAT CONTAINS TOP SECRET INFORMATION.

e. Overwrite all addressable locations with a character, its complement, then a random character.

f. Each overwrite must reside in memory for a period longer than the classified data resided.

g. Remove all power to include battery power.

h. Overwrite all locations with a random pattern, all locations with binary zeros, all locations with binary ones.

i. Perform a full chip erase as per manufacturer’s data sheets.

j. Perform i above, then c above, a total of three times.

k. Perform an ultraviolet erase according to manufacturer’s recommendation.

l. Perform k above, but increase time by a factor of three.

m. Destroy – Disintegrate, incinerate, pulverize, shred, or melt.

n. Destruction required only if classified information is contained.

o. Run five pages of unclassified text (font test acceptable).

p. Ribbons must be destroyed. Platens must be cleaned.

q. Inspect and/or test screen surface for evidence of burned-in information. If present, the cathode ray tube must be destroyed.

Leave a Reply

Your email address will not be published. Required fields are marked *